Skip to main content - access key m.
Skip to main navigation - access key n.


Yiorgos Makris

ECSN 4.914
The University of Texas at Dallas
800 West Campbell Road
Richardson, TX 75080, USA
Phone: 972-883-4360
Mailstop: EC33

Trusted and RELiable Architectures (TRELA) Lab, ECSN 4.618

Personal Web Page







 ee faculty

Yiorgos Makris



Dipl. Eng. in Computer Engineering and Informatics, University of Patras, Greece, 1995
M.S. in Computer Engineering, UC San Diego, La Jolla, CA, 1998
Ph.D. in Computer Engineering, UC San Diego, La Jolla, CA, 2001


Yiorgos is a professor in the department of Electrical Engineering at the Erik Jonsson School of Engineering & Computer Science at The University of Texas at Dallas. Prior to joining UTDallas in July 2011, he spent 10,5 years as a faculty of Electrical Engineering and of Computer Science at Yale University. He holds a Ph.D. (2001) and an M.S. (1997) in Computer Engineering from the University of California, San Diego, and a Diploma of Engineering (1995) in Computer Engineering and Informatics from the University of Patras, Greece.

At UT Dallas, he leads the Trusted and RELiable Architectures (TRELA) research laboratory. His research interests lie in the application of machine learning and statistical analysis towards developing reliable and trusted integrated circuits, with particular emphasis in the analog/RF domain. His research activities have been supported by NSF, ARO, SRC, DARPA, Boeing, IBM, LSI, Intel, and TI.

Yiorgos served as the program chair of the IEEE VLSI Test Symposium in 2013-2014 and of the Test Technology Educational Program (TTEP) in 2010-2012. He also served as a guest editor for the IEEE Transactions on Computers and the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, and as a topic coordinator and/or program committee member for several IEEE and ACM conferences. He is a Senior Member of the IEEE, a recipient of the 2006 Sheffield Distinguished Teaching Award and a recipient of the Best Paper Award from the 2013 Design Automation and Test in Europe (DATE'13) conference

Research Interests

VLSI Testing, Hardware Security, Trusted Integrated Circuits, Reliability, Computer Architecture, Machine Learning, Test Analytics