ECSN 4.914
Mailstop: EC33

Yiorgos (Georgios) Makris


Dipl. Eng. in Computer Engineering and Informatics, University of Patras, Greece, 1995 M.S. in Computer Engineering, UC San Diego, La Jolla, CA, 1998 Ph.D. in Computer Engineering, UC San Diego, La Jolla, CA, 2001


Yiorgos has been on the faculty of the Electrical and Computer Engineering department at the Erik Jonsson School of Engineering & Computer Science at The University of Texas at Dallas, since July 2011. Prior to joining UT Dallas, he spent 10.5 years as a faculty of Electrical Engineering and of Computer Science at Yale University. At UT Dallas, he leads the Trusted and RELiable Architectures (TRELA) Research Laboratory. His main research interests lie in the application of machine learning and statistical analysis in the design of trusted and reliable integrated circuits and systems, with particular emphasis in the analog/RF domain. He is also investigating hardware-based malware detection, forensics and reliability methods in modern microprocessors, as well as on-die learning and novel computational modalities using emerging technologies. His research activities have been supported by NSF, ARO, SRC, DARPA, Boeing, IBM, LSI, Intel, and TI.

Yiorgos served as the 2016-2017 general chair and the 2013-2014 program chair of the IEEE VLSI Test Symposium as well as the 2010-2012 program chair of the Test Technology Educational Program (TTEP). He is as an associate editor of the IEEE Transactions on Information Forensics and Security, the IEEE Design & Test periodical and the Springer Journal of Electronic Testing: Theory and Applications and he has also served as a guest editor for the IEEE Transactions on Computers and the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, and as a topic coordinator and/or program committee member for several IEEE and ACM conferences. He is a Senior Member of the IEEE, a recipient of the 2006 Sheffield Distinguished Teaching Award and a recipient of the Best Paper Award from the 2013 Design Automation and Test in Europe (DATE’13) conference and the 2015 VLSI Test Symposium (VTS’15).

Research Interests

CE;Circuits;Computing Systems